High-spatial resolution compositionally-sensitive imaging of metallic particles using plasmon energy-loss electrons in TEM

Lattice imaging using plasmon energy-loss electrons in an energy-filtered transmission electron microscope

Lattice images formed by plasmon energy-loss electrons in an energy-filtered transmission electron microscope are compared for different experimental parameters. The image resolution is primarily determined by chromatic aberration which is controlled by the width of the energy selection window. With an energy slit 3 eV in width, the plasmon loss electron image shows the same resolution and cont...

Improving High Resolution TEM Images using Low Energy Ion Milling

Ion beam milling has become a widespread specimen preparation technique for non-biological materials over the last two decades, particularly for cross-sectional and plan-view transmission electron microscope (TEM) specimens. The basic principle of ion milling involves bombarding a specimen with energetic ions or neutral atoms acclerated and formed into a tightly focused ion beam. Material is sp...

High Spatial Resolution Lipid Imaging

First application of Cc-corrected imaging for high-resolution and energy-filtered TEM.

Contrast-transfer calculations indicate that C(c) correction should be highly beneficial for high-resolution and energy-filtered transmission electron microscopy. A prototype of an electron optical system capable of correcting spherical and chromatic aberration has been used to verify these calculations. A strong improvement in resolution at an acceleration voltage of 80 kV has been measured. O...

Energy-filtering TEM at high magnification: spatial resolution and detection limits.

Energy-filtering TEM (EFTEM) has turned out to be a very efficient and rapid tool for the chemical characterization of a specimen on a nanometer and even subnanometer length scale. Especially, the detection and measurement of very thin layers has become a great application of this technique in many materials science fields, e.g. semiconductors and hard disk technology. There, the reliability of...